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A Model DrivenTesting Solution for Embedded System with Simulink/Stateflow Model
文献类型:会议
作者:Dong, Yunwei[1]  Li, Zhe[2]  Cheng, Yibo[3]  Zhao, Hongbin[4]  
机构:[1]School of Computer Science, School of Software and Microelectronics, Northwestern Polytechnic University, Xi'an, China
[2]School of Computer Science, School of Software and Microelectronics, Northwestern Polytechnic University, Xi'an, China
[3]School of Computer Science, School of Software and Microelectronics, Northwestern Polytechnic University, Xi'an, China
[4]Information and Telecommunication Company of Shaanxi Electric Power Corporation, State Grid Corporation of China, Xi'an, China
年:2015
通讯作者:Dong, YW (reprint author), Northwestern Polytech Univ, Sch Software & Microelect, Sch Comp Sci, Xian 710072, Peoples R China.
会议名称:Second International Conference on Trustworthy Systems and Their Applications
会议论文集:2015 SECOND INTERNATIONAL CONFERENCE ON TRUSTWORTH
页码范围:16-21
会议地点:Hualien, TAIWAN
会议开始日期:2015-11-23
收录情况:EI(20161302167426)  CPCI-S(WOS:000380455200003)  
所属部门:计算机学院;软件与微电子学院
人气指数:1885
浏览次数:1868
语言:外文
关键词:Simulink/Stateflow; Mode Driven Testing; Embedded System; Hierarchical Interface Automata
摘要:
The Simulink/Stateflow is a commonly used approach in modeling embedded systems. This paper presents a model driven testing method for embedded systems using Simulink/Stateflow model, where a test model of a system constructed with Simulink/Stateflow is to be converted to hierarchical interface automata. Dependencies within hierarchical interface automata and test sequences are acquired through analyzing model state coverage. And then a solver tool, named Yices, is used to solve linear constrain ...More
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